"S-EBIT II: An Electron Beam Ion Trap for HITRAP." GSI Helmholtz Center for Heavy-Ion Research, 2024. Kluge, H.-J., et al. "HITRAP: A Facility at GSI for Highly Charged Ions." arXiv preprint arXiv:0710 [...] S-EBIT An Electron Beam Ion Trap (EBIT) provides highly charged ions (HCI) for spectroscopy and other experiments. To this end, a nearly monoenergetic electron beam is used. In interactions with the electrons [...] electrons from the beam, neutral atoms or positively charged ions can be stripped of bound electrons by means of electron impact ionization. The electron beam originates at a so-called “electron gun”, is