Yulia Shutko

Research and Development

Phone: +49-6159-71-3110

Room: BR3 1.118

Email: Yulia Shutko

https://www.gsi.de/fileadmin/SD/Team/Julia.jpg

My PhD work deals with a non-interceptive transverse beam profile diagnostic method, namely the Beam Induced Fluorescence (BIF) profile monitor for high current heavy ion beam. This monitor is based on the photon detection of excited residual gas molecules.

  •  I executed transverse profile and spectroscopic experiments at the high energy beam transport lines behind the SIS18 synchrotron.
  • Image intensified and electron-multiplied CCD cameras were compared.
  • I developed comprehensive data processing algorithms for the analysis.
  • Moreover, I am involved in collaboration with TU-Munich related to the underlying atomic physics processes.