GSI Helmholtzzentrum für Schwerionenforschung GmbH, Darmstadt
   


Veranstaltungskalender


IT/EE-Palaver

  • Dienstag, 22. Mai 2012   10.00 Uhr -- Seminarraum Theorie, Südbau, III. Stock
    Herr Kayser, Herr Klaproth, Fa. SmartOptics
    "WDM Grundlagen"
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  • Dienstag, 05. Juni 2012   10.00 Uhr -- Seminarraum Theorie, Südbau, III. Stock
    Stefan Haller, GSI
    "Konferenzbericht Linuxtag 2012"
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  • Dienstag, 12. Juni 2012   10.00 Uhr -- Seminarraum Theorie, Südbau, III. Stock
    Dr. Daniel Baumeister, Continental Teves AG & Co. oHG
    "Evaluation of Chip-Level Irradiation Effects in a 32-bit Safety Microcontroller for Automotive Braking Applications"

    A custom-specific microcontroller unit with a dual-redundant lock-step architecture was irradiated with alpha and neutron particles in static and dynamic modes. Static tests were performed on SRAMs. Dynamic tests operate the device in a hardware-in-the-loop setup, executing an anti-lock braking maneuver during irradiation. The lock-step architecture of the microcontroller along with various on-chip monitors provides an increased visibility to system-level single event effects where non-redundant systems supply less monitoring capabilities. Data from the accelerated static and dynamic tests will be discussed and correlated to each other as well as to automotive field return rates.

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Letzte Änderung: 19. Okt. 2004 von admin